Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6
| Parent link: | The Soviet journal of nondestructive testing.— , 1965- Vol. 20, iss. 6.— 1984.— P. 388-391 |
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| প্রধান লেখক: | |
| অন্যান্য লেখক: | |
| সংক্ষিপ্ত: | Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
1984
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| বিষয়গুলি: | |
| বিন্যাস: | গ্রন্থের অধ্যায় |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601421 |
| সংক্ষিপ্ত: | Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует |
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