Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6

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Parent link:The Soviet journal of nondestructive testing.— , 1965-
Vol. 20, iss. 6.— 1984.— P. 388-391
Hlavní autor: Vavilov V. P. Vladimir Platonovich
Další autoři: Kaiko V.L.
Shrnutí:Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out.
В фонде НТБ ТПУ отсутствует
Jazyk:angličtina
Vydáno: 1984
Témata:
Médium: Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601421