Advanced Analytical Techniques for Characterization of 2D Materials, A

Xehetasun bibliografikoak
Egile nagusia:	Rout, Chandra Sekhar
Beste egile batzuk:	Late, Dattatray J.
Gaia:	online resource (232 pages) text
Hizkuntza:	ingelesa
Argitaratua:	Melville, New York AIP Publishing 2022
Gaiak:	SCIENCE / Chemistry/Analytic TECHNOLOGY & ENGINEERING / Materials Science/Thin Films, Surfaces & Interfaces SCIENCE / Spectroscopy & Spectrum Analysis
Sarrera elektronikoa:	https://doi.org/10.1063/9780735425422
Formatua:	Baliabide elektronikoa Liburua

Internet

https://doi.org/10.1063/9780735425422