Defect and ion distribution studies in ion-implanted silicon
| Parent link: | Slow Positron Beam Techniques & Applications (SLOPOS-15).— 2019.— [P. 89] |
|---|---|
| Ente Autore: | Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики |
| Altri autori: | Semek (Simek) K. Kshishtof, Jerzy D. Dryzek, Mitura-Nowak M. Marzena, Lomygin A. D. Anton Dmitrievich |
| Riassunto: | Title screen |
| Lingua: | inglese |
| Pubblicazione: |
2019
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| Soggetti: | |
| Accesso online: | https://physics.mff.cuni.cz/kfnt/slopos/files/SLOPOS-15-book-of-abstracts.pdf#page=92 |
| Natura: | Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667775 |
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Documenti analoghi
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