Defect and ion distribution studies in ion-implanted silicon; Slow Positron Beam Techniques & Applications (SLOPOS-15)

Defect and ion distribution studies in ion-implanted silicon; Slow Positron Beam Techniques & Applications (SLOPOS-15)

Bibliographic Details
Parent link:	Slow Positron Beam Techniques & Applications (SLOPOS-15).— 2019.— [P. 89]
Corporate Author:	Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики
Other Authors:	Semek (Simek) K. Kshishtof, Jerzy D. Dryzek, Mitura-Nowak M. Marzena, Lomygin A. D. Anton Dmitrievich
Summary:	Title screen
Language:	English
Published:	2019
Subjects:	труды учёных ТПУ электронный ресурс
Online Access:	https://physics.mff.cuni.cz/kfnt/slopos/files/SLOPOS-15-book-of-abstracts.pdf#page=92
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667775

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