Accumulation of Defects in Polycrystalline Copper-Aluminum Solid Solutions and the Role of Stacking Fault Energy; Bulletin of the Russian Academy of Sciences: Physics; Vol. 85, iss. 9

Detaylı Bibliyografya
Parent link:Bulletin of the Russian Academy of Sciences: Physics
Vol. 85, iss. 9.— 2021.— [P. 937-940]
Müşterek Yazar: Национальный исследовательский Томский политехнический университет Школа базовой инженерной подготовки Отделение естественных наук
Diğer Yazarlar: Koneva N. A. Nina Aleksandrovna, Trishkina L. I. Lyudmila Iljinichna, Cherkasova T. V. Tatyana Viktorovna, Popova N. A. Nataljya Anatoljevna, Cherkasov N. V. Nikita Vladislavovich
Özet:Title screen
Transmission diffraction electron microscopy is used to study the evolution of a dislocation structure during active plastic deformation in copper-aluminum alloys in the 0-14 at % Al range of concentrations. Types of dislocation substructures are determined from micrographs, depending on the concentration of the alloying element. The parameters of the defect structure are measured and their relationship to stacking fault energy is established.
Режим доступа: по договору с организацией-держателем ресурса
Dil:İngilizce
Baskı/Yayın Bilgisi: 2021
Konular:
Online Erişim:https://doi.org/10.3103/S1062873821090197
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666682
Diğer Bilgiler
Özet:Title screen
Transmission diffraction electron microscopy is used to study the evolution of a dislocation structure during active plastic deformation in copper-aluminum alloys in the 0-14 at % Al range of concentrations. Types of dislocation substructures are determined from micrographs, depending on the concentration of the alloying element. The parameters of the defect structure are measured and their relationship to stacking fault energy is established.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.3103/S1062873821090197