Physical Modeling of Dislocation Connection in LEDs under Different External Impacts; Instruments and Experimental Techniques; Vol. 64, iss. 5

Detalhes bibliográficos
Parent link:Instruments and Experimental Techniques
Vol. 64, iss. 5.— 2021.— [P. 720-728]
Autor Corporativo: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики
Outros Autores: Gradoboev A. V. Aleksandr Vasilyevich, Orlova K. N. Kseniya Nikolaevna, Simonova A. V. Anastasiya Vladimirovna, Sednev V. V. Vyacheslav Vladimirovich
Resumo:Title screen
A method for physical modeling of the influence of bulk leakage-current channels (dislocations) on the electrophysical and lighting characteristics of LEDs by connecting the p-n junction of an LED in parallel to an ohmic resistance or another p-n junction is described. The relationships that allow one to determine the change in the electrophysical and lighting characteristics of LEDs under the influence of various external factors (ionizing radiation, long-term operation, etc.) have been established. Using the obtained relationships, it is possible to determine the electrophysical characteristics of dislocations according to the changes in the electrophysical and lighting characteristics of LEDs, taking the role of dislocations into account. Based on the literature data, the efficiency of using the established relationships in the analysis of the characteristics of LEDs that are exposed to external impacts has been shown.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglês
Publicado em: 2021
Assuntos:
Acesso em linha:https://doi.org/10.1134/S0020441221040151
Formato: Recurso Eletrônico Capítulo de Livro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666371

MARC

LEADER 00000naa0a2200000 4500
001 666371
005 20250215151339.0
035 |a (RuTPU)RU\TPU\network\37575 
035 |a RU\TPU\network\37524 
090 |a 666371 
100 |a 20211220d2021 k||y0rusy50 ba 
101 1 |a eng 
102 |a US 
135 |a drgn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Physical Modeling of Dislocation Connection in LEDs under Different External Impacts  |f A. V. Gradoboev, K. N. Orlova, A. V. Simonova, V. V. Sednev 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 20 tit.] 
330 |a A method for physical modeling of the influence of bulk leakage-current channels (dislocations) on the electrophysical and lighting characteristics of LEDs by connecting the p-n junction of an LED in parallel to an ohmic resistance or another p-n junction is described. The relationships that allow one to determine the change in the electrophysical and lighting characteristics of LEDs under the influence of various external factors (ionizing radiation, long-term operation, etc.) have been established. Using the obtained relationships, it is possible to determine the electrophysical characteristics of dislocations according to the changes in the electrophysical and lighting characteristics of LEDs, taking the role of dislocations into account. Based on the literature data, the efficiency of using the established relationships in the analysis of the characteristics of LEDs that are exposed to external impacts has been shown. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Instruments and Experimental Techniques 
463 |t Vol. 64, iss. 5  |v [P. 720-728]  |d 2021 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a физическое моделирование 
610 1 |a светодиоды 
610 1 |a электрофизические характеристики 
610 1 |a дислокации 
610 1 |a внешние воздействия 
701 1 |a Gradoboev  |b A. V.  |c physicist  |c Professor of Yurga technological Institute of Tomsk Polytechnic University, Doctor of technical sciences  |f 1952-  |g Aleksandr Vasilyevich  |3 (RuTPU)RU\TPU\pers\34242  |9 17773 
701 1 |a Orlova  |b K. N.  |g Kseniya Nikolaevna 
701 1 |a Simonova  |b A. V.  |g Anastasiya Vladimirovna 
701 1 |a Sednev  |b V. V.  |c specialist in the field of mechanical engineering  |c senior lecturer of Yurga technological Institute of Tomsk Polytechnic University  |f 1981-  |g Vyacheslav Vladimirovich  |3 (RuTPU)RU\TPU\pers\35101  |9 18376 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа ядерных технологий  |b Отделение экспериментальной физики  |3 (RuTPU)RU\TPU\col\23549 
801 2 |a RU  |b 63413507  |c 20230711  |g RCR 
856 4 |u https://doi.org/10.1134/S0020441221040151 
942 |c CF