Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation; NDT & E International; Vol. 124
| Parent link: | NDT & E International Vol. 124.— 2021.— [102522, 9 p.] |
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| Korporace: | , |
| Další autoři: | , , , |
| Shrnutí: | Title screen An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters. Режим доступа: по договору с организацией-держателем ресурса |
| Jazyk: | angličtina |
| Vydáno: |
2021
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| Témata: | |
| On-line přístup: | https://doi.org/10.1016/j.ndteint.2021.102522 |
| Médium: | MixedMaterials Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665699 |
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| 200 | 1 | |a Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation |f D. A. Nesteruk, V. P. Vavilov, A. O. Chulkov, D. Burleigh | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 25 tit.] | ||
| 330 | |a An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t NDT & E International | ||
| 463 | |t Vol. 124 |v [102522, 9 p.] |d 2021 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a thermal nondestructive testing | |
| 610 | 1 | |a defect characterization | |
| 610 | 1 | |a thermal quadrupoles | |
| 610 | 1 | |a polynomial fitting | |
| 610 | 1 | |a неразрушающий контроль | |
| 610 | 1 | |a дефекты | |
| 610 | 1 | |a полиномы | |
| 701 | 1 | |a Nesteruk |b D. A. |c specialist in the field of descriptive geometry |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences |f 1979- |g Denis Alekseevich |3 (RuTPU)RU\TPU\pers\31502 |9 15663 | |
| 701 | 1 | |a Vavilov |b V. P. |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT) |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) |f 1949- |g Vladimir Platonovich |3 (RuTPU)RU\TPU\pers\32161 |9 16163 | |
| 701 | 1 | |a Chulkov |b A. O. |c specialist in the field of non-destructive testing |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1989- |g Arseniy Olegovich |3 (RuTPU)RU\TPU\pers\32220 |9 16220 | |
| 701 | 1 | |a Burleigh |b D. |g Douglas | |
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