Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation; NDT & E International; Vol. 124
| Parent link: | NDT & E International Vol. 124.— 2021.— [102522, 9 p.] |
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| সংস্থা লেখক: | , |
| অন্যান্য লেখক: | , , , |
| সংক্ষিপ্ত: | Title screen An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters. Режим доступа: по договору с организацией-держателем ресурса |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
2021
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| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://doi.org/10.1016/j.ndteint.2021.102522 |
| বিন্যাস: | বৈদ্যুতিক গ্রন্থের অধ্যায় |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665699 |