Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation

Bibliographic Details
Parent link:NDT & E International
Vol. 124.— 2021.— [102522, 9 p.]
Corporate Authors: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Бетатронная томография крупногабаритных объектов", Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Тепловой контроль"
Other Authors: Nesteruk D. A. Denis Alekseevich, Vavilov V. P. Vladimir Platonovich, Chulkov A. O. Arseniy Olegovich, Burleigh D. Douglas
Summary:Title screen
An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2021
Subjects:
Online Access:https://doi.org/10.1016/j.ndteint.2021.102522
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665699