Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation

Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation

Библиографические подробности
Источник:NDT & E International
Vol. 124.— 2021.— [102522, 9 p.]
Корпоративные авторы: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Бетатронная томография крупногабаритных объектов", Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Тепловой контроль"
Другие авторы: Nesteruk D. A. Denis Alekseevich, Vavilov V. P. Vladimir Platonovich, Chulkov A. O. Arseniy Olegovich, Burleigh D. Douglas
Примечания:Title screen
An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters.
Режим доступа: по договору с организацией-держателем ресурса
Язык:английский
Опубликовано: 2021
Предметы:
электронный ресурс
труды учёных ТПУ
thermal nondestructive testing
defect characterization
thermal quadrupoles
polynomial fitting
неразрушающий контроль
дефекты
полиномы
Online-ссылка:https://doi.org/10.1016/j.ndteint.2021.102522
Формат: Электронный ресурс Статья
Запись в KOHA:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665699
Описание
Примечания:Title screen
An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1016/j.ndteint.2021.102522

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