Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method; Applied Sciences; Vol. 10, iss. 7
| Parent link: | Applied Sciences Vol. 10, iss. 7.— 2020.— [2351,11 p.] |
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| Korporacja: | |
| Kolejni autorzy: | , , , , , , , , |
| Streszczenie: | Title screen In this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%. |
| Język: | angielski |
| Wydane: |
2020
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| Hasła przedmiotowe: | |
| Dostęp online: | http://earchive.tpu.ru/handle/11683/68965 https://doi.org/10.3390/app10072351 |
| Format: | Elektroniczne Rozdział |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665406 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 665406 | ||
| 005 | 20250203154134.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\36605 | ||
| 035 | |a RU\TPU\network\36113 | ||
| 090 | |a 665406 | ||
| 100 | |a 20210922d2020 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a CH | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method |f M. M. Groz, M. Bensalem, A. Sommier [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 40 tit.] | ||
| 330 | |a In this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%. | ||
| 461 | |t Applied Sciences | ||
| 463 | |t Vol. 10, iss. 7 |v [2351,11 p.] |d 2020 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a thermal resistance estimation IR thermography | |
| 610 | 1 | |a inverse processing | |
| 701 | 1 | |a Groz |b M. M. |g Marie-Marthe | |
| 701 | 1 | |a Bensalem |b M. | |
| 701 | 1 | |a Sommier |b A. | |
| 701 | 1 | |a Abisset-Chavanne |b E. | |
| 701 | 1 | |a Chevalier |b S. | |
| 701 | 1 | |a Chulkov |b A. O. |c specialist in the field of non-destructive testing |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1989- |g Arseniy Olegovich |3 (RuTPU)RU\TPU\pers\32220 |9 16220 | |
| 701 | 1 | |a Battaglia |b J. L. | |
| 701 | 1 | |a Batsale |b J. Ch. |g Jean Christophe | |
| 701 | 1 | |a Pradere |b Ch. |g Christophe | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Центр промышленной томографии |b Международная научно-образовательная лаборатория неразрушающего контроля |3 (RuTPU)RU\TPU\col\19961 |
| 801 | 2 | |a RU |b 63413507 |c 20211126 |g RCR | |
| 856 | 4 | |u http://earchive.tpu.ru/handle/11683/68965 | |
| 856 | 4 | |u https://doi.org/10.3390/app10072351 | |
| 942 | |c CF | ||