Automatic device for testing thermal resistance with thermoelectric effect

Opis bibliograficzny
Parent link:Journal of Physics: Conference Series
Vol. 1499: Actual Trends in Radiophysics.— 2020.— [012047, 7 p.]
Korporacja: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Kolejni autorzy: Vasiljev I. M., Soldatov A. I. Aleksey Ivanovich, Dementjev A. A., Soldatov A. A. Andrey Alekseevich, Abouellail A. Akhmed
Streszczenie:Title screen
This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
Wydane: 2020
Hasła przedmiotowe:
Dostęp online:http://earchive.tpu.ru/handle/11683/72806
https://doi.org/10.1088/1742-6596/1499/1/012047
Format: Elektroniczne Rozdział
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665176

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