Automatic device for testing thermal resistance with thermoelectric effect

Bibliographic Details
Parent link:	Journal of Physics: Conference Series Vol. 1499: Actual Trends in Radiophysics.— 2020.— [012047, 7 p.]
Corporate Author:	Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Other Authors:	Vasiljev I. M., Soldatov A. I. Aleksey Ivanovich, Dementjev A. A., Soldatov A. A. Andrey Alekseevich, Abouellail A. Akhmed
Summary:	Title screen This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
Published:	2020
Subjects:	электронный ресурс труды учёных ТПУ автоматические устройства проверки термическое сопротивление термоэлектрический эффект термоинтерфейсы
Online Access:	http://earchive.tpu.ru/handle/11683/72806 https://doi.org/10.1088/1742-6596/1499/1/012047
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665176

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