Automatic device for testing thermal resistance with thermoelectric effect; Journal of Physics: Conference Series; Vol. 1499: Actual Trends in Radiophysics
| Parent link: | Journal of Physics: Conference Series Vol. 1499: Actual Trends in Radiophysics.— 2020.— [012047, 7 p.] |
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| সংস্থা লেখক: | |
| অন্যান্য লেখক: | , , , , |
| সংক্ষিপ্ত: | Title screen This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application. |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
2020
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| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | http://earchive.tpu.ru/handle/11683/72806 https://doi.org/10.1088/1742-6596/1499/1/012047 |
| বিন্যাস: | বৈদ্যুতিক গ্রন্থের অধ্যায় |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665176 |
| সংক্ষিপ্ত: | Title screen This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application. |
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| ডিওআই: | 10.1088/1742-6596/1499/1/012047 |