On the self-testing (m,n)-code checker design; IOP Conference Series: Materials Science and Engineering; Vol. 1019 : 14th International Forum on Strategic Technology (IFOST 2019)

On the self-testing (m,n)-code checker design; IOP Conference Series: Materials Science and Engineering; Vol. 1019 : 14th International Forum on Strategic Technology (IFOST 2019)

Dettagli Bibliografici
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 1019 : 14th International Forum on Strategic Technology (IFOST 2019).— 2021.— [012098, 9 p.]
Autore principale: Butorina N.
Ente Autore: Национальный исследовательский Томский политехнический университет Инженерная школа информационных технологий и робототехники Отделение информационных технологий
Altri autori: Burkatovskaya Yu. B. Yuliya Borisovna, Pakhomova E.
Riassunto:Title screen
We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker.
Lingua:inglese
Pubblicazione: 2021
Soggetti:
электронный ресурс
труды учёных ТПУ
дизайн
самотестирование
программы
Accesso online:http://earchive.tpu.ru/handle/11683/64587
https://doi.org/10.1088/1757-899X/1019/1/012098
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663611

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