On the self-testing (m,n)-code checker design
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 1019 : 14th International Forum on Strategic Technology (IFOST 2019).— 2021.— [012098, 9 p.] |
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| Summary: | Title screen We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker. |
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2021
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| Online Access: | http://earchive.tpu.ru/handle/11683/64587 https://doi.org/10.1088/1757-899X/1019/1/012098 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663611 |