Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams; Technical Physics Letters; Vol. 46, iss. 4
| Parent link: | Technical Physics Letters Vol. 46, iss. 4.— 2020.— [P. 354-356] |
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| Autor principal: | |
| Autor corporatiu: | , |
| Altres autors: | , |
| Sumari: | Title screen An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
| Publicat: |
2020
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| Matèries: | |
| Accés en línia: | https://doi.org/10.1134/S1063785020040136 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=662598 |
| Sumari: | Title screen An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1134/S1063785020040136 |