Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams

Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams

Bibliographic Details
Parent link:Technical Physics Letters
Vol. 46, iss. 4.— 2020.— [P. 354-356]
Main Author: Ryzhkov V. A. Vladislav Andreevich
Corporate Authors: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Физико-технический институт Лаборатория № 33 ядерного реактора
Other Authors: Nechaev B. A. Boris Aleksandrovich, Padalko V. N. Vladimir Nikolaevich
Summary:Title screen
An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2020
Subjects:
электронный ресурс
труды учёных ТПУ
surface contamination
energy input
ablative plasma
hydrogen
carbon
поверхностное загрязнение
абляционная плазма
водород
углерод
Online Access:https://doi.org/10.1134/S1063785020040136
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=662598

Internet

https://doi.org/10.1134/S1063785020040136

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