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Defect and ion distribution studies in ion-implanted silicon

Defect and ion distribution studies in ion-implanted silicon

Bibliographic Details
Parent link:Slow Positron Beam Techniques and Applications (SLOPOS-15): Book of Abstracts 15th International Workshop, Prague, September 2-6, 2019. [P. 89].— , 2019
Corporate Author: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики
Other Authors: Siemek K., Dryzek J., Mitura-Nowak M., Lomygin A. Anton
Summary:Title screen
Published: 2019
Subjects:
электронный ресурс
труды учёных ТПУ
Online Access:https://physics.mff.cuni.cz/kfnt/slopos/files/SLOPOS-15-book-of-abstracts.pdf#page=92
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661412
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https://physics.mff.cuni.cz/kfnt/slopos/files/SLOPOS-15-book-of-abstracts.pdf#page=92

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