Influence of a Hydrogen Atmosphere on the Properties of an Aluminum Oxide Film on VT1-0 Titanium; Technical Physics; Vol. 64, iss. 4
| Источник: | Technical Physics Vol. 64, iss. 4.— 2019.— [P. 518-522] |
|---|---|
| Корпоративные авторы: | , , |
| Другие авторы: | , , , , |
| Примечания: | Title screen In this study, we have considered interaction between an aluminum oxide film magnetron-sputtered on commercially pure VT1-0 titanium and a hydrogen atmosphere. The time the system was exposed to hydrogen varied from 1 to 4 h with all other parameters remaining the same. Data for the distribution of hydrogen over the depth (film thickness) and its content in the thin-film system have been obtained, and the influence of the hold time in hydrogen on the adhesion and friction coefficient of the film has been revealed. In addition, the surface conductivity and hydrogen distribution in the aluminum oxide film have been determined. Режим доступа: по договору с организацией-держателем ресурса |
| Язык: | английский |
| Опубликовано: |
2019
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| Предметы: | |
| Online-ссылка: | https://doi.org/10.1134/S1063784219040236 |
| Формат: | Электронный ресурс Статья |
| Запись в KOHA: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661001 |
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| 200 | 1 | |a Influence of a Hydrogen Atmosphere on the Properties of an Aluminum Oxide Film on VT1-0 Titanium |f V. S. Sypchenko [et al.] | |
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| 300 | |a Title screen | ||
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| 330 | |a In this study, we have considered interaction between an aluminum oxide film magnetron-sputtered on commercially pure VT1-0 titanium and a hydrogen atmosphere. The time the system was exposed to hydrogen varied from 1 to 4 h with all other parameters remaining the same. Data for the distribution of hydrogen over the depth (film thickness) and its content in the thin-film system have been obtained, and the influence of the hold time in hydrogen on the adhesion and friction coefficient of the film has been revealed. In addition, the surface conductivity and hydrogen distribution in the aluminum oxide film have been determined. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Technical Physics | ||
| 463 | |t Vol. 64, iss. 4 |v [P. 518-522] |d 2019 | ||
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| 701 | 1 | |a Sypchenko |b V. S. |c physicist |c Associate Professor of Tomsk Polytechnic University, Candidate of Sciences |f 1987- |g Vladimir Sergeevich |3 (RuTPU)RU\TPU\pers\33791 |9 17389 | |
| 701 | 0 | |a Wang Cailun | |
| 701 | 1 | |a Nikitenkov |b N. N. |c Russian physicist |c Professor of Tomsk Polytechnic University, Doctor of Physical and Mathematical Sciences |f 1953- |g Nikolai Nikolaevich |3 (RuTPU)RU\TPU\pers\30409 | |
| 701 | 1 | |a Sigfusson |b T. I. |g Torsteinn Ingi | |
| 701 | 1 | |a Kiseleva |b E. S. |c physicist |c Senior Lecturer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1982- |g Evgeniya Sergeevna |y Tomsk |3 (RuTPU)RU\TPU\pers\43298 |9 21639 | |
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