Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

Bibliographic Details
Parent link:	Materials Science Forum: Scientific Journal Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II.— 2019.— [P. 41-46]
Corporate Author:	Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
Other Authors:	Afanasyev M. S. Mikhail, Luchnikov P. A. Petr, Afanasjev S. A. Sergei, Malakhova O. A. Olga, Moyzes B. B. Boris Borisovich
Summary:	Title screen The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy. Режим доступа: по договору с организацией-держателем ресурса
Language:	English
Published:	2019
Subjects:	электронный ресурс труды учёных ТПУ Diamond-Like Film Dielectric Losses Ferroelectric Gas-Phase Deposition Nanosized Film SHF Wave Guide сегнетоэлектрики диэлектрические потери газофазное осаждение наноразмерные пленки СВЧ алмазоподобные пленки
Online Access:	https://doi.org/10.4028/www.scientific.net/MSF.970.41
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660913

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