Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

書目詳細資料
Parent link:Materials Science Forum: Scientific Journal
Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II.— 2019.— [P. 41-46]
企業作者: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
其他作者: Afanasyev M. S. Mikhail, Luchnikov P. A. Petr, Afanasjev S. A. Sergei, Malakhova O. A. Olga, Moyzes B. B. Boris Borisovich
總結:Title screen
The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy.
Режим доступа: по договору с организацией-держателем ресурса
語言:英语
出版: 2019
主題:
在線閱讀:https://doi.org/10.4028/www.scientific.net/MSF.970.41
格式: 電子 Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660913