Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

ग्रंथसूची विवरण
Parent link:Materials Science Forum: Scientific Journal
Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II.— 2019.— [P. 41-46]
निगमित लेखक: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
अन्य लेखक: Afanasyev M. S. Mikhail, Luchnikov P. A. Petr, Afanasjev S. A. Sergei, Malakhova O. A. Olga, Moyzes B. B. Boris Borisovich
सारांश:Title screen
The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy.
Режим доступа: по договору с организацией-держателем ресурса
भाषा:अंग्रेज़ी
प्रकाशित: 2019
विषय:
ऑनलाइन पहुंच:https://doi.org/10.4028/www.scientific.net/MSF.970.41
स्वरूप: MixedMaterials इलेक्ट्रोनिक पुस्तक अध्याय
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660913