Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF

Podrobná bibliografie
Parent link:Materials Science Forum: Scientific Journal
Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II.— 2019.— [P. 41-46]
Korporativní autor: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
Další autoři: Afanasyev M. S. Mikhail, Luchnikov P. A. Petr, Afanasjev S. A. Sergei, Malakhova O. A. Olga, Moyzes B. B. Boris Borisovich
Shrnutí:Title screen
The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy.
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2019
Témata:
On-line přístup:https://doi.org/10.4028/www.scientific.net/MSF.970.41
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660913