Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF; Materials Science Forum; Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II

Dettagli Bibliografici
Parent link:Materials Science Forum: Scientific Journal
Vol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II.— 2019.— [P. 41-46]
Ente Autore: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
Altri autori: Afanasyev M. S. Mikhail, Luchnikov P. A. Petr, Afanasjev S. A. Sergei, Malakhova O. A. Olga, Moyzes B. B. Boris Borisovich
Riassunto:Title screen
The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy.
Режим доступа: по договору с организацией-держателем ресурса
Lingua:inglese
Pubblicazione: 2019
Soggetti:
электронный ресурс
труды учёных ТПУ
Diamond-Like Film
Dielectric Losses
Ferroelectric
Gas-Phase Deposition
Nanosized Film
SHF Wave Guide
сегнетоэлектрики
диэлектрические потери
газофазное осаждение
наноразмерные пленки
СВЧ
алмазоподобные пленки
Accesso online:https://doi.org/10.4028/www.scientific.net/MSF.970.41
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660913
Descrizione
Riassunto:Title screen
The article considers the issues of receiving nanosized Ba[0,8]Sr[0,2]TiO3 ferroelectric films and diamond-like films in the range of 10‒60 GHz with various thickness between 0.1‒10 [mu]m and their dielectric properties. Peculiarities of SHF dissipation measuring method in dielectric films are discussed. It shows the influence of structural perfection of films on the value of losses of SHF energy.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.4028/www.scientific.net/MSF.970.41

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