High-intensity pulsed ion beam focusing by iys own charge; 6th International Congress on Energy Fluxes and Radiation Effects; 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22

High-intensity pulsed ion beam focusing by iys own charge; 6th International Congress on Energy Fluxes and Radiation Effects; 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22

Chi tiết về thư mục
Parent link:	6th International Congress on Energy Fluxes and Radiation Effects: abstracts, Tomsk, September 16-22, 2018 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22.— 2018.— [P. 36]
Nhiều tác giả của công ty:	Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Отделение материаловедения, Национальный исследовательский Томский политехнический университет Школа базовой инженерной подготовки Отделение иностранных языков
Tác giả khác:	Pushkarev A. I. Aleksandr Ivanovich, Prima A. I. Artem Igorevich, Zhu X. P., Ding L., Zhang Q., Zhang C. C., Egorova Yu. I. Yulia Ivanovna, Lei M. K. Ming Kai
Tóm tắt:	Title screen
Ngôn ngữ:	Tiếng Anh
Được phát hành:	2018
Những chủ đề:	электронный ресурс труды учёных ТПУ ионные пучки
Truy cập trực tuyến:	http://efre2018.hcei.tsc.ru/publication/abstract.html
Định dạng:	Điện tử Chương của sách
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660566

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