Influence of radiation-induced defects on the overheating of a metal target; 6th International Congress on Energy Fluxes and Radiation Effects; 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22
| Parent link: | 6th International Congress on Energy Fluxes and Radiation Effects: abstracts, Tomsk, September 16-22, 2018 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22.— 2018.— [P. 42] |
|---|---|
| Corporate Authors: | Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Отделение материаловедения, Национальный исследовательский Томский политехнический университет Школа базовой инженерной подготовки Отделение иностранных языков |
| Outros Autores: | Egorova Yu. I. Yulia Ivanovna, Prima A. I. Artem Igorevich, Zhu X. P., Ding L., Zhang Q., Pushkarev A. I. Aleksandr Ivanovich, Lei M. K. Ming Kai |
| Resumo: | Title screen |
| Idioma: | inglês |
| Publicado em: |
2018
|
| Assuntos: | |
| Acesso em linha: | http://efre2018.hcei.tsc.ru/publication/abstract.html |
| Formato: | Recurso Electrónico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660565 |
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