Influence of radiation-induced defects on the overheating of a metal target; 6th International Congress on Energy Fluxes and Radiation Effects; 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22
| Parent link: | 6th International Congress on Energy Fluxes and Radiation Effects: abstracts, Tomsk, September 16-22, 2018 20th International Symposium on High-Current Electronics (20SHCE), Tomsk, September 16-22.— 2018.— [P. 42] |
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| Enti autori: | , |
| Altri autori: | , , , , , , |
| Riassunto: | Title screen |
| Lingua: | inglese |
| Pubblicazione: |
2018
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| Soggetti: | |
| Accesso online: | http://efre2018.hcei.tsc.ru/publication/abstract.html |
| Natura: | Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660565 |