Destruction of LED heterostructures under high-current electron beam irradiation; IOP Conference Series: Materials Science and Engineering; Vol. 511 : Perspective Materials of Constructional and Medical Purpose

গ্রন্থ-পঞ্জীর বিবরন
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 511 : Perspective Materials of Constructional and Medical Purpose.— 2019.— [012004, 5 p.]
প্রধান লেখক: Zixuan Li
সংস্থা লেখক: Томский политехнический университет
অন্যান্য লেখক: Jiyao Xian, Sysoyeva S. G.
সংক্ষিপ্ত:Title screen
This paper presents the experimental results of the fracture morphology of InGaN/GaN heterostructures and epitaxial GaN layers deposited on sapphire substrates after irradiation with high current electron beams. A special type of damage - microspheres, ~1-5 [mu]m was discovered and studied. The results show that the microspheres act as diffractive optical elements redistributing the stimulated emission of InGaN/GaN in space.
ভাষা:ইংরেজি
প্রকাশিত: 2019
বিষয়গুলি:
অনলাইন ব্যবহার করুন:http://dx.doi.org/10.1088/1757-899X/511/1/012004
http://earchive.tpu.ru/handle/11683/55437
বিন্যাস: বৈদ্যুতিক গ্রন্থের অধ্যায়
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660530