Effect of intense electron and ion irradiation on optical absorption of boron carbide thin films; Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology; Vol. 173, iss. 11-12

מידע ביבליוגרפי
Parent link:Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology
Vol. 173, iss. 11-12.— 2018.— [P. 1075-1082]
Corporate Authors: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий"
מחברים אחרים: Remnev G. E. Gennady Efimovich, Musil J. Jindrrich, Tarbokov V. A. Vladislav Aleksandrovich, Pavlov S. K. Sergey Konstantinovich, Konusov F. V. Fedor Valerievich, Egorov I. S. Ivan Sergeevich, Gadirov R. M. Ruslan Mukhamedzhanovich, Kabyshev A. V. Alexander Vasilievich, Javdosnak D. Daniel, Zenkin S. P. Sergey Petrovich
סיכום:Title screen
The energetic characteristics of growth and radiation defects (RDs) in boron carbide films deposited by reactive magnetron sputtering on a steel substrate and irradiated with powerful electron and pulsed ion beams were investigated. The relationship between the characteristics of point RDs, the degree of distortion of the electronic structure and the characteristics of interband and exponential absorption was established. The absorption spectra of the films were due to electronic transitions between the defects energy states localized in the band gap and interband transitions. The stability of characteristics to electron irradiation was due to the high concentration of growth defects, distributed along the boundaries between the structural fragments. Short-pulse implantation of carbon ions stimulates partial annealing of intrinsic RDs and their redistribution and formation of thermally stable complexes from defects. Boron carbide films significantly exceed the radiation resistance of sodium calcium silicate glass, but are slightly inferior to the films of aluminum and silicon nitrides, obtained by magnetron deposition.
Режим доступа: по договору с организацией-держателем ресурса
שפה:אנגלית
יצא לאור: 2018
נושאים:
גישה מקוונת:https://doi.org/10.1080/10420150.2018.1539732
פורמט: אלקטרוני Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659742

MARC

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200 1 |a Effect of intense electron and ion irradiation on optical absorption of boron carbide thin films  |f G. E. Remnev [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 17 tit.] 
330 |a The energetic characteristics of growth and radiation defects (RDs) in boron carbide films deposited by reactive magnetron sputtering on a steel substrate and irradiated with powerful electron and pulsed ion beams were investigated. The relationship between the characteristics of point RDs, the degree of distortion of the electronic structure and the characteristics of interband and exponential absorption was established. The absorption spectra of the films were due to electronic transitions between the defects energy states localized in the band gap and interband transitions. The stability of characteristics to electron irradiation was due to the high concentration of growth defects, distributed along the boundaries between the structural fragments. Short-pulse implantation of carbon ions stimulates partial annealing of intrinsic RDs and their redistribution and formation of thermally stable complexes from defects. Boron carbide films significantly exceed the radiation resistance of sodium calcium silicate glass, but are slightly inferior to the films of aluminum and silicon nitrides, obtained by magnetron deposition. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology 
463 |t Vol. 173, iss. 11-12  |v [P. 1075-1082]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a radiation defect 
610 1 |a absorption 
610 1 |a nanocomposite film 
610 1 |a localized states 
610 1 |a pulsed ion implantation 
610 1 |a радиационные дефекты 
610 1 |a поглощения 
610 1 |a нанокомпозитные материалы 
610 1 |a локализованные состояния 
610 1 |a ионная имплантация 
701 1 |a Remnev  |b G. E.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1948-  |g Gennady Efimovich  |3 (RuTPU)RU\TPU\pers\31500 
701 1 |a Musil  |b J.  |g Jindrrich 
701 1 |a Tarbokov  |b V. A.  |c specialist in the field of material science  |c Leading engineer of Tomsk Polytechnic University, Candidate of technical sciences  |f 1969-  |g Vladislav Aleksandrovich  |3 (RuTPU)RU\TPU\pers\41878 
701 1 |a Pavlov  |b S. K.  |c physicist  |c Engineer of Tomsk Polytechnic University  |f 1990-  |g Sergey Konstantinovich  |3 (RuTPU)RU\TPU\pers\32875 
701 1 |a Konusov  |b F. V.  |c physicist  |c Lead Engineer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1958-  |g Fedor Valerievich  |3 (RuTPU)RU\TPU\pers\32570  |9 16491 
701 1 |a Egorov  |b I. S.  |c physicist  |c Researcher of Tomsk Polytechnic University, Candidate of technical sciences  |f 1985-  |g Ivan Sergeevich  |y Tomsk  |3 (RuTPU)RU\TPU\pers\32792  |9 16650 
701 1 |a Gadirov  |b R. M.  |g Ruslan Mukhamedzhanovich 
701 1 |a Kabyshev  |b A. V.  |c specialist in the field of electric power engineering  |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1958-  |g Alexander Vasilievich  |3 (RuTPU)RU\TPU\pers\32572 
701 1 |a Javdosnak  |b D.  |g Daniel 
701 1 |a Zenkin  |b S. P.  |c physicist  |c Researcher of Tomsk Polytechnic University  |f 1988-  |g Sergey Petrovich  |3 (RuTPU)RU\TPU\pers\41880 
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