Effect of intense electron and ion irradiation on optical absorption of boron carbide thin films

Bibliographic Details
Parent link:Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology
Vol. 173, iss. 11-12.— 2018.— [P. 1075-1082]
Corporate Authors: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий"
Other Authors: Remnev G. E. Gennady Efimovich, Musil J. Jindrrich, Tarbokov V. A. Vladislav Aleksandrovich, Pavlov S. K. Sergey Konstantinovich, Konusov F. V. Fedor Valerievich, Egorov I. S. Ivan Sergeevich, Gadirov R. M. Ruslan Mukhamedzhanovich, Kabyshev A. V. Alexander Vasilievich, Javdosnak D. Daniel, Zenkin S. P. Sergey Petrovich
Summary:Title screen
The energetic characteristics of growth and radiation defects (RDs) in boron carbide films deposited by reactive magnetron sputtering on a steel substrate and irradiated with powerful electron and pulsed ion beams were investigated. The relationship between the characteristics of point RDs, the degree of distortion of the electronic structure and the characteristics of interband and exponential absorption was established. The absorption spectra of the films were due to electronic transitions between the defects energy states localized in the band gap and interband transitions. The stability of characteristics to electron irradiation was due to the high concentration of growth defects, distributed along the boundaries between the structural fragments. Short-pulse implantation of carbon ions stimulates partial annealing of intrinsic RDs and their redistribution and formation of thermally stable complexes from defects. Boron carbide films significantly exceed the radiation resistance of sodium calcium silicate glass, but are slightly inferior to the films of aluminum and silicon nitrides, obtained by magnetron deposition.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 2018
Subjects:
Online Access:https://doi.org/10.1080/10420150.2018.1539732
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659742