Statistical Regularity in LTD Technology; 20th International Symposium on High-Current Electronics (ISHCE)

Statistical Regularity in LTD Technology; 20th International Symposium on High-Current Electronics (ISHCE)

Detalhes bibliográficos
Parent link:20th International Symposium on High-Current Electronics (ISHCE).— 2018.— [P. 123-125]
Autor Corporativo: Национальный исследовательский Томский политехнический университет (ТПУ)
Outros Autores: Kim A. A., Alekseenko V. M. Vitaly Mikhaylovich, Kondratiev S. S., Sinebrukhov V. A.
Resumo:Title screen
In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglês
Publicado em: 2018
Assuntos:
электронный ресурс
труды учёных ТПУ
Linear transformer driver (LTD)
spark gap switch
standard deviation (jitter)
линейные трансформаторы
переключатели
драйверы
искровые разрядники
джиттер
моделирование
замыкания
Acesso em linha:https://doi.org/10.1109/ISHCE.2018.8521228
Formato: Recurso Eletrônico Capítulo de Livro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659353

Registros relacionados

Registros relacionados