Statistical Regularity in LTD Technology
| Parent link: | 20th International Symposium on High-Current Electronics (ISHCE): proceedings, Tomsk, Russia, September 16-22, 2018/ National Research Tomsk Polytechnic University (TPU) ; Institute of Electrical and Electronics Engineers (IEEE). [P. 123-125].— , 2018 |
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| Інші автори: | , , , |
| Резюме: | Title screen In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group. Режим доступа: по договору с организацией-держателем ресурса |
| Мова: | Англійська |
| Опубліковано: |
2018
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| Предмети: | |
| Онлайн доступ: | https://doi.org/10.1109/ISHCE.2018.8521228 |
| Формат: | Електронний ресурс Частина з книги |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659353 |