Statistical Regularity in LTD Technology; 20th International Symposium on High-Current Electronics (ISHCE)
| Parent link: | 20th International Symposium on High-Current Electronics (ISHCE).— 2018.— [P. 123-125] |
|---|---|
| Autor corporatiu: | |
| Altres autors: | , , , |
| Sumari: | Title screen In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
| Publicat: |
2018
|
| Matèries: | |
| Accés en línia: | https://doi.org/10.1109/ISHCE.2018.8521228 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659353 |