Statistical Regularity in LTD Technology; 20th International Symposium on High-Current Electronics (ISHCE)

Dettagli Bibliografici
Parent link:20th International Symposium on High-Current Electronics (ISHCE).— 2018.— [P. 123-125]
Ente Autore: Национальный исследовательский Томский политехнический университет (ТПУ)
Altri autori: Kim A. A., Alekseenko V. M. Vitaly Mikhaylovich, Kondratiev S. S., Sinebrukhov V. A.
Riassunto:Title screen
In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.
Режим доступа: по договору с организацией-держателем ресурса
Lingua:inglese
Pubblicazione: 2018
Soggetti:
Accesso online:https://doi.org/10.1109/ISHCE.2018.8521228
Natura: MixedMaterials Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659353

MARC

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320 |a [References: p. 125 (3 tit.)] 
330 |a In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 0 |0 (RuTPU)RU\TPU\network\27883  |t 20th International Symposium on High-Current Electronics (ISHCE)  |o proceedings, Tomsk, Russia, September 16-22, 2018  |f National Research Tomsk Polytechnic University (TPU) ; Institute of Electrical and Electronics Engineers (IEEE)  |v [P. 123-125]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a Linear transformer driver (LTD) 
610 1 |a spark gap switch 
610 1 |a standard deviation (jitter) 
610 1 |a линейные трансформаторы 
610 1 |a переключатели 
610 1 |a драйверы 
610 1 |a искровые разрядники 
610 1 |a джиттер 
610 1 |a моделирование 
610 1 |a замыкания 
610 1 |a искровые разрядники 
701 1 |a Kim  |b A. A. 
701 1 |a Alekseenko  |b V. M.  |c specialist in the field of electronics  |c Assistant of the Department of Tomsk Polytechnic University  |f 1984-  |g Vitaly Mikhaylovich  |2 stltpush  |3 (RuTPU)RU\TPU\pers\36970 
701 1 |a Kondratiev  |b S. S. 
701 1 |a Sinebrukhov  |b V. A. 
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