Structure, Mechanical and Optical Properties of Silicon-Rich Al–Si–N Films Prepared by High Power Impulse Magnetron Sputtering; Coatings; Vol. 9, iss. 1

Xehetasun bibliografikoak
Parent link:Coatings
Vol. 9, iss. 1.— 2019.— [53, 6 p.]
Erakunde egilea: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Beste egile batzuk: Zenkin S. P. Sergey Petrovich, Konusov F. V. Fedor Valerievich, Lauk A. L. Aleksandr Lukyanovich, Zelentsov D. Yu. Denis Yurjevich, Demchenko S. G. Stanislav Gennadjevich
Gaia:Title screen
This article reports on the influence of the sputtering parameters (discharge voltage, average target power density) of a high power impulse magnetron discharge (HiPIMS) on the structure, mechanical and optical properties of silicon-rich Al–Si–N films. We show that with the change of a discharge target power density in the range of 30–120 W/cm2, the hardness of the sputtered Al–Si–N films nonlinearly changes in the range of 22–29 GPa, while the concentration of the absorption centers changes in the range of 1018–1020/cm3. The optical spectra of the HiPIMS sputtered films are completely different from the Al–Si–N films prepared by a direct current magnetron sputtering, with an absence of “monoenergetic” optical absorption centers, which are attributed to point defects.
Hizkuntza:ingelesa
Argitaratua: 2019
Gaiak:
Sarrera elektronikoa:http://dx.doi.org/10.3390/coatings9010053
Formatua: MixedMaterials Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659302

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200 1 |a Structure, Mechanical and Optical Properties of Silicon-Rich Al–Si–N Films Prepared by High Power Impulse Magnetron Sputtering  |f S. P. Zenkin [et al.] 
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300 |a Title screen 
320 |a [References: 21 tit.] 
330 |a This article reports on the influence of the sputtering parameters (discharge voltage, average target power density) of a high power impulse magnetron discharge (HiPIMS) on the structure, mechanical and optical properties of silicon-rich Al–Si–N films. We show that with the change of a discharge target power density in the range of 30–120 W/cm2, the hardness of the sputtered Al–Si–N films nonlinearly changes in the range of 22–29 GPa, while the concentration of the absorption centers changes in the range of 1018–1020/cm3. The optical spectra of the HiPIMS sputtered films are completely different from the Al–Si–N films prepared by a direct current magnetron sputtering, with an absence of “monoenergetic” optical absorption centers, which are attributed to point defects. 
461 |t Coatings 
463 |t Vol. 9, iss. 1  |v [53, 6 p.]  |d 2019 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a HiPIMS 
610 1 |a Al–Si–N 
610 1 |a silicon nitride 
610 1 |a microstructure 
610 1 |a нитрид кремния 
610 1 |a микроструктура 
701 1 |a Zenkin  |b S. P.  |c physicist  |c Researcher of Tomsk Polytechnic University  |f 1988-  |g Sergey Petrovich  |3 (RuTPU)RU\TPU\pers\41880 
701 1 |a Konusov  |b F. V.  |c physicist  |c Lead Engineer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1958-  |g Fedor Valerievich  |3 (RuTPU)RU\TPU\pers\32570  |9 16491 
701 1 |a Lauk  |b A. L.  |c Physicist  |c Leading engineer of Tomsk Polytechnic University  |f 1957-  |g Aleksandr Lukyanovich  |3 (RuTPU)RU\TPU\pers\37675 
701 1 |a Zelentsov  |b D. Yu.  |g Denis Yurjevich 
701 1 |a Demchenko  |b S. G.  |g Stanislav Gennadjevich 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Исследовательская школа физики высокоэнергетических процессов  |c (2017- )  |3 (RuTPU)RU\TPU\col\23551 
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