Investigating Thin Ti–O–N Films Deposited via Reactive Magnetron Sputtering; Bulletin of the Russian Academy of Sciences: Physics; Vol. 82, iss. 9

Investigating Thin Ti–O–N Films Deposited via Reactive Magnetron Sputtering; Bulletin of the Russian Academy of Sciences: Physics; Vol. 82, iss. 9

Sonraí bibleagrafaíochta
Parent link:	Bulletin of the Russian Academy of Sciences: Physics: Scientific Journal.— , 2007- Vol. 82, iss. 9.— 2018.— [P. 1143-1147]
Príomhchruthaitheoir:	Boytsova E. L. Elena Lvovna
Údar corparáideach:	Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение ядерно-топливного цикла
Rannpháirtithe:	Leonova L. A. Liliya Aleksandrovna
Achoimre:	Title screen Infrared spectroscopy and atomic emission analysis help establish the corrosion resistance of Ti‒O-N films deposited on steel substrates via reactive magnetron sputtering, along with potential biological activity by detecting nitric oxide in model solutions after contact with Ti-O-N coatings. Differential thermal analysis and scanning electron microscopy allow the thermal stability of the films to be judged at temperatures of up to 1300°C. Режим доступа: по договору с организацией-держателем ресурса
Teanga:	Béarla
Foilsithe / Cruthaithe:	2018
Ábhair:	электронный ресурс труды учёных ТПУ инфракрасная спектроскопия коррозионная стойкость магнетронное распыление
Rochtain ar líne:	https://doi.org/10.3103/S1062873818090058
Formáid:	Leictreonach Caibidil leabhair
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=658737

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