The Interface Influence in TiN/SiN x Multilayer Nanocomposite Under Irradiation

Sonraí bibleagrafaíochta
Parent link:Russian Physics Journal
Vol. 60, iss. 9.— 2018.— [P. 1600-1609]
Údar corparáideach: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Rannpháirtithe: Uglov V. V. Vladimir Vasilievich, Safronov I. V., Kvasov N. T. Nikolay Trafimovich, Remnev G. E. Gennady Efimovich, Shimanskii V. I. Vitali Igorevich
Achoimre:Title screen
The paper focuses on studying the kinetics of radiation-induced point defects formed in TiN/SiN x multilayer nanocomposites with account of their generation, diffusion recombination, and the influence of sinks functioning as interfaces. In order to describe the kinetics in nanocrystalline TiN and amorphous SiN x phases, a finite-difference method is used to solve the system of balance kinetic equations for absolute defect concentrations depending on the spatiotemporal variables. A model of the disclination-dislocation interface structure is used to study the absorption of radiation-induced point defects on the boundaries in created stress fields. It is shown that the interface effectively absorbs point defects in these phases of TiN/SiN x multilayer nanocomposite, thereby reducing their amount within the space between phases. This behavior of point defects partially explains a mechanism of the radiation resistance in this type of nanocomposites.
Режим доступа: по договору с организацией-держателем ресурса
Teanga:Béarla
Foilsithe / Cruthaithe: 2018
Ábhair:
Rochtain ar líne:https://doi.org/10.1007/s11182-018-1257-1
Formáid: Leictreonach Caibidil leabhair
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=657945

MARC

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200 1 |a The Interface Influence in TiN/SiN x Multilayer Nanocomposite Under Irradiation  |f V. V. Uglov [et al.] 
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300 |a Title screen 
320 |a [References: 29 tit.] 
330 |a The paper focuses on studying the kinetics of radiation-induced point defects formed in TiN/SiN x multilayer nanocomposites with account of their generation, diffusion recombination, and the influence of sinks functioning as interfaces. In order to describe the kinetics in nanocrystalline TiN and amorphous SiN x phases, a finite-difference method is used to solve the system of balance kinetic equations for absolute defect concentrations depending on the spatiotemporal variables. A model of the disclination-dislocation interface structure is used to study the absorption of radiation-induced point defects on the boundaries in created stress fields. It is shown that the interface effectively absorbs point defects in these phases of TiN/SiN x multilayer nanocomposite, thereby reducing their amount within the space between phases. This behavior of point defects partially explains a mechanism of the radiation resistance in this type of nanocomposites. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Russian Physics Journal 
463 |t Vol. 60, iss. 9  |v [P. 1600-1609]  |d 2018 
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701 1 |a Uglov  |b V. V.  |c Physicist  |c Leading researcher of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1954-  |g Vladimir Vasilievich  |3 (RuTPU)RU\TPU\pers\36737 
701 1 |a Safronov  |b I. V. 
701 1 |a Kvasov  |b N. T.  |c physicist  |c leading researcher of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1949-  |g Nikolay Trafimovich  |3 (RuTPU)RU\TPU\pers\36768 
701 1 |a Remnev  |b G. E.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1948-  |g Gennady Efimovich  |3 (RuTPU)RU\TPU\pers\31500 
701 1 |a Shimanskii  |b V. I.  |c Physicist  |c Associate Scientist of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1986-  |g Vitali Igorevich  |3 (RuTPU)RU\TPU\pers\36738 
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