New microfocus bremsstrahlung source based on betatron B-18 for high-resolution radiography and tomography

ग्रंथसूची विवरण
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 289 : Modern Technologies for Non-Destructive Testing.— 2018.— [012044, 5 p.]
अन्य लेखक: Rychkov M. M. Maksim Mikhailovich, Kaplin V. V. Valery Viktorovich, Malikov E. L. Evgeny Lvovich (L'vovich), Smolyanskiy V. A. Vladimir Aleksandrovich, Stepanov I. B. Igor Borisovich, Lutsenko A. S. Artem Sergeevich, Gentselman V. Valentin, Vaskovsky I. K. Ivan Kirillovich
सारांश:Title screen
New microfocus source of hard bremsstrahlung (photon energy > 1 MeV), based on the betatron B-18 with a narrow Ta target inside, for high-resolution radiography and tomography is presented. The first studies of the source demonstrate its possibilities for practical applications to detect the microdefects in products made from heavy materials and to control gaps in joints of parts of composite structures of engineering facilities. The radiography method was used to investigate a compound object consisting of four vertically arranged steel bars between which surfaces were exposed gaps of 10 [mu]m in width. The radiographic image of the object, obtained with a magnification of 2.4, illustrates the good sensitivity of detecting the gaps between adjacent bars, due to the small width of the linear focus of the bremsstrahlung source.
भाषा:अंग्रेज़ी
प्रकाशित: 2018
विषय:
ऑनलाइन पहुंच:http://dx.doi.org/10.1088/1757-899X/289/1/012044
http://earchive.tpu.ru/handle/11683/47007
स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=657685