Feasibility of using T-shaped feedback in teraohmmeters

Detaylı Bibliyografya
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 289 : Modern Technologies for Non-Destructive Testing.— 2018.— [012008, 6 p.]
Yazar: Yermoshin N. I.
Müşterek Yazar: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
Diğer Yazarlar: Yakimov E. V. Evgeny Valeryevich
Özet:Title screen
The paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%).
Dil:İngilizce
Baskı/Yayın Bilgisi: 2018
Konular:
Online Erişim:http://dx.doi.org/10.1088/1757-899X/289/1/012008
http://earchive.tpu.ru/handle/11683/47010
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=657668

MARC

LEADER 00000nla2a2200000 4500
001 657668
005 20240112144617.0
035 |a (RuTPU)RU\TPU\network\24320 
035 |a RU\TPU\network\24319 
090 |a 657668 
100 |a 20180305a2018 k y0engy50 ba 
101 0 |a eng 
102 |a GB 
105 |a y z 100zy 
135 |a drgn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Feasibility of using T-shaped feedback in teraohmmeters  |f N. I. Yermoshin, E. V. Yakimov 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 9 tit.] 
330 |a The paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%). 
461 0 |0 (RuTPU)RU\TPU\network\2008  |t IOP Conference Series: Materials Science and Engineering 
463 0 |0 (RuTPU)RU\TPU\network\24148  |t Vol. 289 : Modern Technologies for Non-Destructive Testing  |o 6th International Conference, 9–14 October 2017, Tomsk, Russian Federation  |o [proceedings]  |v [012008, 6 p.]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a обратная связь 
610 1 |a тераомметры 
610 1 |a выходное напряжение 
610 1 |a изоляция 
610 1 |a электрооборудование 
610 1 |a изоляционные материалы 
610 1 |a дефекты 
700 1 |a Yermoshin  |b N. I. 
701 1 |a Yakimov  |b E. V.  |c specialist in the field of control and measurement equipment  |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences  |f 1975-  |g Evgeny Valeryevich  |3 (RuTPU)RU\TPU\pers\31173  |9 15369 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Отделение контроля и диагностики  |3 (RuTPU)RU\TPU\col\23584 
801 2 |a RU  |b 63413507  |c 20180329  |g RCR 
856 4 |u http://dx.doi.org/10.1088/1757-899X/289/1/012008 
856 4 |u http://earchive.tpu.ru/handle/11683/47010 
942 |c CF