Feasibility of using T-shaped feedback in teraohmmeters; IOP Conference Series: Materials Science and Engineering; Vol. 289 : Modern Technologies for Non-Destructive Testing
| Источник: | IOP Conference Series: Materials Science and Engineering Vol. 289 : Modern Technologies for Non-Destructive Testing.— 2018.— [012008, 6 p.] |
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| Примечания: | Title screen The paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%). |
| Язык: | английский |
| Опубликовано: |
2018
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| Online-ссылка: | http://dx.doi.org/10.1088/1757-899X/289/1/012008 http://earchive.tpu.ru/handle/11683/47010 |
| Формат: | Электронный ресурс Статья |
| Запись в KOHA: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=657668 |