X-ray Tomographic System Behavior Prediction Based on a Mathematical Model
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 189 : Modern Technologies for Non-Destructive Testing.— 2017.— [012016, 6 p.] |
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| Главный автор: | |
| Другие авторы: | , |
| Примечания: | Title screen There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters. |
| Язык: | английский |
| Опубликовано: |
2017
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| Предметы: | |
| Online-ссылка: | http://dx.doi.org/10.1088/1757-899X/189/1/012016 http://earchive.tpu.ru/handle/11683/38507 |
| Формат: | Электронный ресурс Статья |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654813 |