Structural features of N-containing titanium dioxide thin films deposited by magnetron sputtering; Thin Solid Films; Vol. 627
| Parent link: | Thin Solid Films.— , 1967- Vol. 627.— 2017.— [P. 9–16] |
|---|---|
| Erakunde egilea: | |
| Beste egile batzuk: | , , , |
| Gaia: | Title screen N-containing titanium dioxide (N-TiO2) thin films have been obtained by the midrange magnetron sputtering with two-component N2/O2 reactive working gas. Complex analysis of the films structure and phase composition demonstrates its significant changes due to nitrogen content. X-ray diffraction data show the anatase-rutile phase transition and crystallites size reduction in N-TiO2 thin films with increase of nitrogen content in the reactive atmosphere. The investigation has been focused on phase transition, zeta potential, chemical bonds and UV-light influence on the wettability of the films versus nitrogen concentration. Hydrophilization of N-TiO2 films surface under UV-light has an irreversible character. Режим доступа: по договору с организацией-держателем ресурса |
| Hizkuntza: | ingelesa |
| Argitaratua: |
2017
|
| Gaiak: | |
| Sarrera elektronikoa: | http://dx.doi.org/10.1016/j.tsf.2017.02.056 |
| Formatua: | Baliabide elektronikoa Liburu kapitulua |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=653798 |