Active thermal NDT: problems and solutions

Manylion Llyfryddiaeth
Parent link:Proceedings of SPIE
Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII.— 2016.— [98610I, 9 p.]
Prif Awdur: Vavilov V. P. Vladimir Platonovich
Awdur Corfforaethol: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
Crynodeb:Title screen
This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Режим доступа: по договору с организацией-держателем ресурса
Cyhoeddwyd: 2016
Cyfres:Nondestructive Testing and Composites
Pynciau:
Mynediad Ar-lein:http://dx.doi.org/10.1117/12.2222980
Fformat: Electronig Pennod Llyfr
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652944

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