Active thermal NDT: problems and solutions; Proceedings of SPIE; Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII

Active thermal NDT: problems and solutions; Proceedings of SPIE; Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII

מידע ביבליוגרפי
Parent link:	Proceedings of SPIE Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII.— 2016.— [98610I, 9 p.]
מחבר ראשי:	Vavilov V. P. Vladimir Platonovich
מחבר תאגידי:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
סיכום:	Title screen This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. Режим доступа: по договору с организацией-держателем ресурса
שפה:	אנגלית
יצא לאור:	2016
סדרה:	Nondestructive Testing and Composites
נושאים:	электронный ресурс труды учёных ТПУ инфракрасное излучение неразрушающий контроль
גישה מקוונת:	http://dx.doi.org/10.1117/12.2222980
פורמט:	אלקטרוני Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652944

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