Active thermal NDT: problems and solutions; Proceedings of SPIE; Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII

Dettagli Bibliografici
Parent link:	Proceedings of SPIE Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII.— 2016.— [98610I, 9 p.]
Autore principale:	Vavilov V. P. Vladimir Platonovich
Ente Autore:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
Riassunto:	Title screen This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. Режим доступа: по договору с организацией-держателем ресурса
Lingua:	inglese
Pubblicazione:	2016
Serie:	Nondestructive Testing and Composites
Soggetti:	электронный ресурс труды учёных ТПУ инфракрасное излучение неразрушающий контроль
Accesso online:	http://dx.doi.org/10.1117/12.2222980
Natura:	Elettronico Capitolo di libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652944

Accesso online

http://dx.doi.org/10.1117/12.2222980