Active thermal NDT: problems and solutions

Bibliographic Details
Parent link:	Proceedings of SPIE Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII.— 2016.— [98610I, 9 p.]
Main Author:	Vavilov V. P. Vladimir Platonovich
Corporate Author:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
Summary:	Title screen This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. Режим доступа: по договору с организацией-держателем ресурса
Published:	2016
Series:	Nondestructive Testing and Composites
Subjects:	электронный ресурс труды учёных ТПУ инфракрасное излучение неразрушающий контроль
Online Access:	http://dx.doi.org/10.1117/12.2222980
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652944

Internet

http://dx.doi.org/10.1117/12.2222980