The Effect of the Electronic Subsystem on the Deformation and Stress Localization in the Surface Layer of Solids; AIP Conference Proceedings; Vol. 1783 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016

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Parent link:AIP Conference Proceedings
Vol. 1783 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016.— 2016.— [020086, 4 p.]
Hlavní autor: Khon Yu. A. Yury
Korporativní autor: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра высшей математики и математической физики (ВММФ)
Další autoři: Kaminskii P. P. Petr, Moldovanova E. A. Evgeniya Aleksandrovna
Shrnutí:Title screen
The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2016
Témata:
On-line přístup:http://dx.doi.org/10.1063/1.4966379
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652673

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