Radiation hardness tests of Avalanche Photodiodesfor FAIR, NICA, and CERN SPS experiments

Bibliographic Details
Parent link:Proceedings of Science
Vol. EPS-HEP 2015 : The European Physical Society Conference on High Energy Physics, 22-29 July 2015, Vienna, Austria.— 2015.— [282, 7 p.]
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра электроники и автоматики физических установок (№ 24) (ЭАФУ)
Other Authors: Mikhaylov V. S. Vasily Sergeevich, Kugler A. Andrey, Kushpil V. Vasily, Tlusty P. Pavel, Svoboda O. Ondrey, Selyuzhenkov I. V. Ilya Vladimirovich, Kushpil S. A. Svetlana Aleksandrovna, Ladygin V. P. Vladimir Pertovich
Summary:Title screen
Modern avalanche photodiodes with high gain are excellent device candidates for the light readout from detectors used for the high energy physics experiments. We report the results of the APDs radiation hardness study. Properties of APDs manufactured by Ketek and Hamamatsu companies has been studied in terms of internal defects accumulation. Test setups for offline and online APD irradiation measurements are described. Simplified models estimating contribution of various noise components are discussed in comparison with data achieved by static and dynamic characteristics analysis. The results of the APDs investigations after irradiation using secondary neutrons from the cyclotron facility U120M at the Nuclear Physics Institute of CAS in Rež are ˇ presented.
Published: 2015
Subjects:
Online Access:http://pos.sissa.it/archive/conferences/234/282/EPS-HEP2015_282.pdf
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=651235

MARC

LEADER 00000naa0a2200000 4500
001 651235
005 20250827105448.0
035 |a (RuTPU)RU\TPU\network\16484 
090 |a 651235 
100 |a 20161107d2015 k||y0rusy50 ba 
101 0 |a eng 
102 |a IT 
135 |a drgn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Radiation hardness tests of Avalanche Photodiodesfor FAIR, NICA, and CERN SPS experiments  |f V. S. Mikhaylov [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 12 tit.] 
330 |a Modern avalanche photodiodes with high gain are excellent device candidates for the light readout from detectors used for the high energy physics experiments. We report the results of the APDs radiation hardness study. Properties of APDs manufactured by Ketek and Hamamatsu companies has been studied in terms of internal defects accumulation. Test setups for offline and online APD irradiation measurements are described. Simplified models estimating contribution of various noise components are discussed in comparison with data achieved by static and dynamic characteristics analysis. The results of the APDs investigations after irradiation using secondary neutrons from the cyclotron facility U120M at the Nuclear Physics Institute of CAS in Rež are ˇ presented. 
461 1 |t Proceedings of Science 
463 1 |t Vol. EPS-HEP 2015 : The European Physical Society Conference on High Energy Physics, 22-29 July 2015, Vienna, Austria  |v [282, 7 p.]  |d 2015 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
701 1 |a Mikhaylov  |b V. S.  |c specialist in the field of automation equipment and electronics  |c Design Engineer of Tomsk Polytechnic University  |f 1989-  |g Vasily Sergeevich  |3 (RuTPU)RU\TPU\pers\36951 
701 1 |a Kugler  |b A.  |g Andrey 
701 1 |a Kushpil  |b V.  |c specialist in the field of automation equipment and electronics  |c Professor of Tomsk Polytechnic University  |f 1959-  |g Vasily  |3 (RuTPU)RU\TPU\pers\36949 
701 1 |a Tlusty  |b P.  |g Pavel 
701 1 |a Svoboda  |b O.  |g Ondrey 
701 1 |a Selyuzhenkov  |b I. V.  |g Ilya Vladimirovich 
701 1 |a Kushpil  |b S. A.  |g Svetlana Aleksandrovna 
701 1 |a Ladygin  |b V. P.  |g Vladimir Pertovich 
712 0 2 |a Национальный исследовательский Томский политехнический университет (ТПУ)  |b Физико-технический институт (ФТИ)  |b Кафедра электроники и автоматики физических установок (№ 24) (ЭАФУ)  |3 (RuTPU)RU\TPU\col\18731 
801 2 |a RU  |b 63413507  |c 20161107  |g RCR 
856 4 |u http://pos.sissa.it/archive/conferences/234/282/EPS-HEP2015_282.pdf 
942 |c CF