High speed brightness amplifiers for diagnostics of fast processes obscured by intense background radiation

Bibliographic Details
Parent link:Recent Advances on Systems, Signals, Control, Communications and Computers, December 12-14, 2015, Budapest, Hungary: Proceedings of the 13th International Conference on Data Networks, Communications, Computers (DNCOCO '15). [P. 141-148].— , 2015
Corporate Authors: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ), Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Кафедра высоковольтной электрофизики и сильноточной электроники (ВЭСЭ)
Other Authors: Evtushenko G. S. Gennady Sergeevich, Trigub M. V. Maksim Viktorovich, Torgaev S. N. Stanislav Nikolaevich, Evtushenko T. G. Tatiana Gennadievna
Summary:Title screen
In this paper the results of using high-speed metal and halide metal vapor brightness amplifiers for visual non-destructive testing of objects and fast processes blocked from observation by the intense background light are given. In particular, the results of visualization of SHS-process, corona discharge and nanoparticle production process are presented. It has been shown that the visualization method proposed in this paper proves to be the most reliable one for obtaining information about the objects or processes in real-time mode.
Published: 2015
Subjects:
Online Access:http://www.wseas.us/e-library/conferences/2015/Budapest/DNCOSE/DNCOSE-20.pdf
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650792