Estimation of the sensitivity in dual wave X-ray absorptiometry

מידע ביבליוגרפי
Parent link:	Journal of Physics: Conference Series Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012032, 6 p.]
מחברים אחרים:	Gogolev A. S. Aleksey Sergeevich, Rezaev R. O. Roman Olegovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Vukolov A. V. Artem Vladimirovich, Gogoleva T. S. Tatiana Sergeevna
סיכום:	Title screen Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices.
שפה:	אנגלית
יצא לאור:	2016
סדרה:	Monochromatic X- and Gamma Beams Produced at Electron Accelerators
נושאים:	электронный ресурс труды учёных ТПУ чувствительность рентгеновская абсорбциометрия рентгеновские излучения текущие среды
גישה מקוונת:	http://dx.doi.org/10.1088/1742-6596/732/1/012032 http://earchive.tpu.ru/handle/11683/33962
פורמט:	אלקטרוני Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650754

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