Estimation of the sensitivity in dual wave X-ray absorptiometry; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Detaylı Bibliyografya
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012032, 6 p.]
Müşterek Yazar: Национальный исследовательский Томский политехнический университет Физико-технический институт
Diğer Yazarlar: Gogolev A. S. Aleksey Sergeevich, Rezaev R. O. Roman Olegovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Vukolov A. V. Artem Vladimirovich, Gogoleva T. S. Tatiana Sergeevna
Özet:Title screen
Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices.
Dil:İngilizce
Baskı/Yayın Bilgisi: 2016
Seri Bilgileri:Monochromatic X- and Gamma Beams Produced at Electron Accelerators
Konular:
Online Erişim:http://dx.doi.org/10.1088/1742-6596/732/1/012032
http://earchive.tpu.ru/handle/11683/33962
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650754