Estimation of the sensitivity in dual wave X-ray absorptiometry; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Manylion Llyfryddiaeth
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012032, 6 p.]
Awdur Corfforaethol: Национальный исследовательский Томский политехнический университет Физико-технический институт
Awduron Eraill: Gogolev A. S. Aleksey Sergeevich, Rezaev R. O. Roman Olegovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Vukolov A. V. Artem Vladimirovich, Gogoleva T. S. Tatiana Sergeevna
Crynodeb:Title screen
Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices.
Iaith:Saesneg
Cyhoeddwyd: 2016
Cyfres:Monochromatic X- and Gamma Beams Produced at Electron Accelerators
Pynciau:
Mynediad Ar-lein:http://dx.doi.org/10.1088/1742-6596/732/1/012032
http://earchive.tpu.ru/handle/11683/33962
Fformat: Electronig Pennod Llyfr
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650754

MARC

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200 1 |a Estimation of the sensitivity in dual wave X-ray absorptiometry  |f A. S. Gogolev [et al.] 
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330 |a Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices. 
461 0 |0 (RuTPU)RU\TPU\network\3526  |t Journal of Physics: Conference Series 
463 0 |0 (RuTPU)RU\TPU\network\15969  |t Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)  |o XI International Symposium, 6–11 September 2015, Saint Petersburg, Russian Federation  |o [proceedings]  |f National Research Tomsk Polytechnic University (TPU)  |v [012032, 6 p.]  |d 2016 
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701 1 |a Gogolev  |b A. S.  |c physicist  |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1983-  |g Aleksey Sergeevich  |3 (RuTPU)RU\TPU\pers\31537  |9 15698 
701 1 |a Rezaev  |b R. O.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1982-  |g Roman Olegovich  |3 (RuTPU)RU\TPU\pers\31777 
701 1 |a Cherepennikov  |b Yu. M.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of Sciences  |f 1989-  |g Yuriy Mihaylovich  |3 (RuTPU)RU\TPU\pers\31561  |9 15721 
701 1 |a Vukolov  |b A. V.  |c physicist  |c Research associate of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1978-  |g Artem Vladimirovich  |3 (RuTPU)RU\TPU\pers\31209  |9 15405 
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