Estimation of the sensitivity in dual wave X-ray absorptiometry
| Parent link: | Journal of Physics: Conference Series Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012032, 6 p.] |
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| Autres auteurs: | , , , , |
| Résumé: | Title screen Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices. |
| Langue: | anglais |
| Publié: |
2016
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| Collection: | Monochromatic X- and Gamma Beams Produced at Electron Accelerators |
| Sujets: | |
| Accès en ligne: | http://dx.doi.org/10.1088/1742-6596/732/1/012032 http://earchive.tpu.ru/handle/11683/33962 |
| Format: | Électronique Chapitre de livre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650754 |
| Résumé: | Title screen Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices. |
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| DOI: | 10.1088/1742-6596/732/1/012032 |